Open AccessBurrows Wheeler Transform Based Test Vector Compression for Digital Circuits
Author(s) -
Anju Asokan,
J. P. Anita
Publication year - 2016
Publication title -
indian journal of science and technology
Language(s) - Uncategorized
Resource type - Journals
eISSN - 0974-6846
pISSN - 0974-5645
DOI - 10.17485/ijst/2016/v9i30/85750
Subject(s) - huffman coding , computer science , test compression , benchmark (surveying) , very large scale integration , chip , computer hardware , encoding (memory) , compression ratio , data compression , compression (physics) , test vector , algorithm , parallel computing , electronic circuit , automatic test pattern generation , embedded system , artificial intelligence , telecommunications , test set , materials science , electrical engineering , geodesy , geography , internal combustion engine , automotive engineering , composite material , engineering