Open AccessA Study on Patent Valuation Important Factors: Focus on China Industry
Author(s) -
Young-Ki Kim,
Seung-Jun Lee,
Seong-Taek Park
Publication year - 2016
Publication title -
indian journal of science and technology
Language(s) - English
Resource type - Journals
eISSN - 0974-6846
pISSN - 0974-5645
DOI - 10.17485/ijst/2016/v9i24/96150
Subject(s) - delphi method , valuation (finance) , delphi , analytic hierarchy process , computer science , consistency (knowledge bases) , actuarial science , business , marketing , risk analysis (engineering) , operations research , mathematics , accounting , artificial intelligence , operating system