Open AccessBuilt-In Self Test and Self-Repairing Circuit for Array Multipliers
Author(s) -
J. R. Alex,
S. Umadevi
Publication year - 2015
Publication title -
indian journal of science and technology
Language(s) - English
Resource type - Journals
eISSN - 0974-6846
pISSN - 0974-5645
DOI - 10.17485/ijst/2015/v8i19/76704
Subject(s) - built in self test , computer science , dissipation , digital pattern generator , redundancy (engineering) , multiplier (economics) , power analysis , embedded system , chip , telecommunications , physics , macroeconomics , economics , thermodynamics , operating system , computer security , cryptography