Open AccessA robust approach for surface defect detection based on one dimensional local binary patterns
Author(s) -
Shervan Fekri-Ershad
Publication year - 2012
Publication title -
indian journal of science and technology
Language(s) - English
Resource type - Journals
eISSN - 0974-6846
pISSN - 0974-5645
DOI - 10.17485/ijst/2012/v5i8.12
Subject(s) - local binary patterns , pattern recognition (psychology) , computer science , artificial intelligence , binary number , logarithm , feature (linguistics) , similarity (geometry) , image (mathematics) , feature extraction , binary image , image processing , surface (topology) , mathematics , histogram , geometry , arithmetic , mathematical analysis , linguistics , philosophy
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