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Application of Mathematical Modeling Methods in the Assessment of Metrological Reliability of Analog-to-Digital Converter Unit
Author(s) -
Т. А. Чернышова,
R. Yu. Kurnosov
Publication year - 2017
Publication title -
vestnik tambovskogo gosudarstvennogo tehničeskogo universiteta
Language(s) - English
Resource type - Journals
eISSN - 2542-1409
pISSN - 0136-5835
DOI - 10.17277/vestnik.2017.04.pp.589-594
Subject(s) - reliability (semiconductor) , reliability engineering , unit (ring theory) , metrology , computer science , analog to digital converter , electronic engineering , engineering , electrical engineering , mathematics , statistics , physics , voltage , power (physics) , mathematics education , quantum mechanics

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