Open AccessMathematical Modeling of the Metrological Characteristics in Assessment of Electronic Metrological Reliability of Electronic Measuring Equipment
Author(s) -
T. I. Сhernyshova,
M. A. Kamenskaya,
R. Yu. Kurnosov
Publication year - 2017
Publication title -
vestnik tambovskogo gosudarstvennogo tehničeskogo universiteta
Language(s) - English
Resource type - Journals
eISSN - 2542-1409
pISSN - 0136-5835
DOI - 10.17277/vestnik.2017.02.pp.209-215
Subject(s) - metrology , reliability (semiconductor) , reliability engineering , electronics , electronic equipment , systems engineering , computer science , engineering , electrical engineering , physics , mathematics , statistics , thermodynamics , power (physics)