Open AccessReliability Criteria for Busbars against Electromagnetic Destruction
Author(s) -
В. А. Иванов,
A. V. Lanovaya,
Alexander Kobelev,
Alexey Nicolaevich Kagdin
Publication year - 2017
Publication title -
vestnik tambovskogo gosudarstvennogo tehničeskogo universiteta
Language(s) - English
Resource type - Journals
eISSN - 2542-1409
pISSN - 0136-5835
DOI - 10.17277/vestnik.2017.01.pp.072-076
Subject(s) - busbar , reliability (semiconductor) , reliability engineering , computer science , engineering , power (physics) , electrical engineering , physics , quantum mechanics