Open AccessMethod to Detect Internal Defects of CMOS-Microcircuits
Author(s) -
I. Yu. Bulaev
Publication year - 2018
Publication title -
raketno-kosmičeskoe priborostroenie i informacionnye sistemy
Language(s) - English
Resource type - Journals
eISSN - 2587-9057
pISSN - 2409-0239
DOI - 10.17238/issn2409-0239.2018.1.93
Subject(s) - cmos , computer science , materials science , optoelectronics , electronic engineering , engineering