Open AccessEvaluation of the calibration reliability of devices tested at several points in the measurement range
Author(s) -
S.I. Danilevich,
V. V. Tretyak
Publication year - 2020
Publication title -
naučnyj vestnik novosibirskogo gosudarstvennogo tehničeskogo universiteta
Language(s) - English
Resource type - Journals
eISSN - 2658-3275
pISSN - 1814-1196
DOI - 10.17212/1814-1196-2020-1-157-164
Subject(s) - reliability (semiconductor) , calibration , range (aeronautics) , reliability engineering , computer science , statistics , materials science , mathematics , engineering , physics , power (physics) , quantum mechanics , composite material