Open AccessRobust methods to improve the reliability of measurement information and their application in IMS mass strength experiments
Author(s) -
Katruk Yurii,
Seriousnov Aleksei,
Trushin Viktor
Publication year - 2016
Publication title -
naučnyj vestnik novosibirskogo gosudarstvennogo tehničeskogo universiteta
Language(s) - English
Resource type - Journals
eISSN - 2658-3275
pISSN - 1814-1196
DOI - 10.17212/1814-1196-2016-2-90-98
Subject(s) - reliability (semiconductor) , reliability engineering , computer science , engineering , physics , power (physics) , quantum mechanics