Open AccessComparative Study of Fault Detection Techniques in Digital Circuits
Author(s) -
Rajeswari Banik,
Koushik Ghosh,
V. Mukherjee
Publication year - 2018
Publication title -
ijireeice
Language(s) - English
Resource type - Journals
eISSN - 2321-5526
pISSN - 2321-2004
DOI - 10.17148/ijireeice.2018.6115
Subject(s) - fault detection and isolation , electronic circuit , digital electronics , computer science , artificial intelligence , engineering , electrical engineering , actuator
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