Open AccessThroughput Testbench Setup Development For Memory Expansion Of Gensets
Author(s) -
Lokesh Khandare,
Darshini Pramod Rathod
Publication year - 2017
Publication title -
international journal of innovative research in electrical, electronics, instrumentation and control engineering
Language(s) - English
Resource type - Journals
eISSN - 2321-5526
pISSN - 2321-2004
DOI - 10.17148/ijireeice.2017.5530
Subject(s) - throughput , computer science , computer architecture , reliability engineering , operating system , engineering , wireless