Open AccessA Study on System Reliability in Weibull Distribution
Author(s) -
Avinash Kumar,
V. Krishnan
Publication year - 2017
Publication title -
ijireeice
Language(s) - English
Resource type - Journals
eISSN - 2321-5526
pISSN - 2321-2004
DOI - 10.17148/ijireeice.2017.5308
Subject(s) - weibull distribution , reliability engineering , reliability (semiconductor) , statistics , computer science , mathematics , environmental science , engineering , physics , thermodynamics , power (physics)
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