Open AccessA Review on Development of a High Resolution Imaging System at 635 nm and 840 nm
Author(s) -
Kartik Shrivastav,
Nalbalwar S.L.,
Roshan Makkar
Publication year - 2019
Publication title -
ijarcce
Language(s) - English
Resource type - Journals
eISSN - 2319-5940
pISSN - 2278-1021
DOI - 10.17148/ijarcce.2019.8627
Subject(s) - resolution (logic) , high resolution , materials science , optics , nanotechnology , computer science , physics , remote sensing , artificial intelligence , geology
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