Open AccessDevelopment of Low Power Test Data Compression Techniques for Digital VLSI Circuits
Author(s) -
Mr. Mohammad Iliyas,
Mrs. Farha Anjum,
Anil Kumar Sharma,
R. Murali Prasad
Publication year - 2016
Publication title -
ijarcce
Language(s) - English
Resource type - Journals
eISSN - 2319-5940
pISSN - 2278-1021
DOI - 10.17148/ijarcce.2016.51297
Subject(s) - very large scale integration , computer science , electronic engineering , test (biology) , data compression , power (physics) , embedded system , engineering , artificial intelligence , physics , quantum mechanics , paleontology , biology
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