
Analysis of Threshold Voltage in Nano-Channel Length MOSFETs
Author(s) -
Sachin Tyagi,
Sunil Kumar,
Abhishek Kumar
Publication year - 2015
Publication title -
international journal of advanced research in computer and communication engineering
Language(s) - English
Resource type - Journals
eISSN - 2319-5940
pISSN - 2278-1021
DOI - 10.17148/ijarcce.2015.45120
Subject(s) - threshold voltage , nano , reverse short channel effect , channel (broadcasting) , materials science , voltage , optoelectronics , electrical engineering , engineering , transistor , composite material