Open AccessSingle-ElectronTransistor Logic for High Reliability of Moore’s Law and Low Power VLSI
Author(s) -
P. Vidya Sekhar,
M. Saran Chowdary,
A. Vamsidhar,
P.V.S.Sri Ram,
N. Venkateswarulu
Publication year - 2015
Publication title -
international journal of advanced research in computer and communication engineering
Language(s) - English
Resource type - Journals
eISSN - 2319-5940
pISSN - 2278-1021
DOI - 10.17148/ijarcce.2015.4399
Subject(s) - reliability (semiconductor) , very large scale integration , reliability engineering , power (physics) , moore's law , computer science , law , political science , engineering , electrical engineering , embedded system , physics , quantum mechanics