Open AccessSelection of Error Metric for Accurate Characterization of a Thin Dielectric or Semiconductor Film on Glass Substrate by the Optimizing Envelope Method
Author(s) -
R. N. Nestorov
Publication year - 2020
Publication title -
international advanced research journal in science, engineering and technology
Language(s) - English
Resource type - Journals
eISSN - 2394-1588
pISSN - 2393-8021
DOI - 10.17148/iarjset.2020.7301
Subject(s) - substrate (aquarium) , materials science , metric (unit) , selection (genetic algorithm) , envelope (radar) , characterization (materials science) , dielectric , semiconductor , thin film , optoelectronics , computer science , electronic engineering , biological system , nanotechnology , artificial intelligence , engineering , telecommunications , biology , radar , operations management , ecology