Validity, Reliability and Item Analysis of AMAIUB Admission Test
Author(s) -
Lina S. Calucag,
Danilo A. Tabalan
Publication year - 2016
Publication title -
iarjset
Language(s) - English
Resource type - Journals
eISSN - 2394-1588
pISSN - 2393-8021
DOI - 10.17148/iarjset.2016.3313
Subject(s) - test (biology) , reliability (semiconductor) , item analysis , psychology , reliability engineering , validity , computer science , psychometrics , clinical psychology , engineering , paleontology , power (physics) , physics , quantum mechanics , biology
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