Open AccessFREE CARRIER RECOMBINATION LIFETIME CALCULATION FROM PHOTOCONDUCTIVITY DECAY MEASUREMENT IN NON–PASSIVATED SILICON
Author(s) -
I. M. Anfimov,
С. П. Кобелева,
A. V. Pylnev,
Ivan Schemerov,
D. S. Egorov,
S. V. Yurchuk
Publication year - 2018
Publication title -
izvestiâ vysših učebnyh zavedenij. materialy èlektronnoj tehniki
Language(s) - English
Resource type - Journals
eISSN - 2413-6387
pISSN - 1609-3577
DOI - 10.17073/1609-3577-2016-3-210-216
Subject(s) - photoconductivity , carrier lifetime , wafer , recombination , relaxation (psychology) , silicon , materials science , diffusion , semiconductor , optoelectronics , computational physics , atomic physics , molecular physics , chemistry , physics , thermodynamics , biochemistry , gene , psychology , social psychology