
CHARGE RELAXATION BASED INTEGRAL–DIFFERENTIAL METHOD OF SEMICONDUCTOR ENERGY LEVEL TEMPERATURE SPECTROSCOPY
Author(s) -
И. Маняхин
Publication year - 2015
Publication title -
izvestiâ vysših učebnyh zavedenij. materialy èlektronnoj tehniki
Language(s) - English
Resource type - Journals
eISSN - 2413-6387
pISSN - 1609-3577
DOI - 10.17073/1609-3577-2013-4-58-62
Subject(s) - semiconductor , relaxation (psychology) , differential (mechanical device) , spectroscopy , condensed matter physics , charge (physics) , materials science , atomic physics , physics , optoelectronics , quantum mechanics , thermodynamics , medicine