Open AccessSTATISTICAL ANALYSIS OF GE INFLUENCE ON RADIATION AND THERMAL STABILITY OF THE ELECTROPHYSICAL CHARACTERISTICS OF CZ–SI <P> BASED DEVICE N—P—N—P–STRUCTURES
Author(s) -
В. Быткин,
В. Критская,
П. Кобелева
Publication year - 2015
Publication title -
izvestiâ vysših učebnyh zavedenij. materialy èlektronnoj tehniki
Language(s) - English
Resource type - Journals
eISSN - 2413-6387
pISSN - 1609-3577
DOI - 10.17073/1609-3577-2013-4-42-48
Subject(s) - thermal stability , germanium , radiation , materials science , statistical analysis , stability (learning theory) , analytical chemistry (journal) , engineering physics , optoelectronics , silicon , physics , nuclear physics , chemistry , chemical engineering , engineering , environmental chemistry , mathematics , statistics , computer science , machine learning