Open AccessFarklı kapı oksitli RadFET dozimetrelerinin ışınlama öncesi elektriksel karakterizasyonlarının TCAD simülasyon programı ile değerlendirilmesi
Author(s) -
Ayşegül Kahraman,
Ercan Yılmaz
Publication year - 2017
Publication title -
sakarya university journal of science
Language(s) - Turkish
Resource type - Journals
eISSN - 2147-835X
pISSN - 1301-4048
DOI - 10.16984/saufenbilder.337279
Subject(s) - dosimeter , materials science , threshold voltage , irradiation , dielectric , optoelectronics , oxide , gate oxide , radiation , voltage , analytical chemistry (journal) , optics , electrical engineering , physics , chemistry , transistor , metallurgy , engineering , chromatography , nuclear physics
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