
Effects of interface states and series resistance on the electrical characteristic of Sc2O3 MOS capacitor
Author(s) -
Ayşegül Kahraman,
Ercan Yılmaz
Publication year - 2018
Publication title -
sakarya üniversitesi fen bilimleri enstitüsü dergisi/sakarya üniversitesi fen bilimleri enstitüsü dergisi
Language(s) - English
Resource type - Journals
eISSN - 2147-835X
pISSN - 1301-4048
DOI - 10.16984/saufenbilder.327593
Subject(s) - physics , materials science , electrical engineering , engineering