Open AccessA Study on the Contents of BJT Business Japanese Proficiency Test
Author(s) -
Jinyoung Bae
Publication year - 2018
Publication title -
ilbon geundaehag yeon'gu
Language(s) - English
Resource type - Journals
eISSN - 1975-1265
pISSN - 1229-9456
DOI - 10.16979/jmak..62.201811.195
Subject(s) - test (biology) , reliability engineering , bipolar junction transistor , engineering , electrical engineering , biology , botany , transistor , voltage