Open AccessA study on reliability and validity of TOEIC receptive skills.
Author(s) -
Youngsuh KIM
Publication year - 2007
Publication title -
stem journal
Language(s) - English
Resource type - Journals
eISSN - 2733-6492
pISSN - 1598-1002
DOI - 10.16875/stem.2007.8.1.169
Subject(s) - toeic , reliability (semiconductor) , psychology , validity , mathematics education , computer science , mathematics , developmental psychology , statistics , psychometrics , significant difference , physics , power (physics) , quantum mechanics
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom