A Study on the Forecasting Model of Technology Life Cycles by Analysis of US Patent Citation
Author(s) -
Sun-Hi Yoo
Publication year - 2004
Publication title -
journal of information management
Language(s) - English
Resource type - Journals
ISSN - 0254-3621
DOI - 10.1633/jim.2004.35.1.093
Subject(s) - patent analysis , computer science , life span , field (mathematics) , exploratory analysis , valuation (finance) , data science , operations research , business , medicine , engineering , gerontology , mathematics , finance , pure mathematics
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