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OPTICAL TESTING OF LAYERED MICROSTRUCTURES WITH AND WITHOUT UNDERLYING VIAS
Author(s) -
Justin R. Serrano,
Leslie M. Phinney
Publication year - 2006
Publication title -
osti oai (u.s. department of energy office of scientific and technical information)
Language(s) - English
Resource type - Conference proceedings
DOI - 10.1615/ihtc13.p14.150
Subject(s) - microstructure , materials science , computer science , optoelectronics , composite material

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