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Out of Distribution Data Detection Using Dropout Bayesian Neural Networks
Author(s) -
André T. Nguyen,
Fred Lu,
Gary Lopez Munoz,
Edward Raff,
Charles Nicholas,
James Holt
Publication year - 2022
Publication title -
proceedings of the aaai conference on artificial intelligence
Language(s) - English
Resource type - Journals
eISSN - 2374-3468
pISSN - 2159-5399
DOI - 10.1609/aaai.v36i7.20757
Subject(s) - dropout (neural networks) , leverage (statistics) , artificial intelligence , computer science , embedding , bayesian probability , malware , artificial neural network , machine learning , metric (unit) , pattern recognition (psychology) , data mining , bayesian network , engineering , operations management , operating system

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