Open AccessExGAN: Adversarial Generation of Extreme Samples
Author(s) -
Siddharth Bhatia,
Arjit Jain,
Bryan Hooi
Publication year - 2021
Publication title -
proceedings of the aaai conference on artificial intelligence
Language(s) - English
Resource type - Journals
eISSN - 2374-3468
pISSN - 2159-5399
DOI - 10.1609/aaai.v35i8.16834
Subject(s) - extreme value theory , computer science , probabilistic logic , range (aeronautics) , sample (material) , baseline (sea) , generalized extreme value distribution , generative grammar , probability distribution , measure (data warehouse) , artificial intelligence , data mining , machine learning , statistics , mathematics , engineering , chemistry , oceanography , chromatography , geology , aerospace engineering
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