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Robust Distance Metric Learning in the Presence of Label Noise
Author(s) -
Dong Wang,
Xiaoyang Tan
Publication year - 2014
Publication title -
proceedings of the aaai conference on artificial intelligence
Language(s) - English
Resource type - Journals
eISSN - 2374-3468
pISSN - 2159-5399
DOI - 10.1609/aaai.v28i1.8903
Subject(s) - overfitting , discriminative model , computer science , artificial intelligence , pattern recognition (psychology) , noise (video) , parametric statistics , metric (unit) , machine learning , mathematics , statistics , artificial neural network , operations management , economics , image (mathematics)

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