Open AccessMultielement analysis of tea by X-ray fluorescence spectrometry with full external reflection
Author(s) -
Artem S. Maltsev,
D. S. Sharykina,
Е. В. Чупарина,
Galina V. Pashkova,
А. Г. Ревенко
Publication year - 2019
Publication title -
analitika i kontrolʹ
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.167
H-Index - 6
eISSN - 2073-1450
pISSN - 2073-1442
DOI - 10.15826/analitika.2019.23.2.009
Subject(s) - x ray fluorescence , suspension (topology) , sample preparation , certified reference materials , matrix (chemical analysis) , analytical chemistry (journal) , fluorescence , chemistry , sample (material) , chromatography , quantitative analysis (chemistry) , mass spectrometry , detection limit , materials science , mathematics , physics , optics , homotopy , pure mathematics