Open AccessAnalog Statistical Design for Manufacturability
Author(s) -
Yushan Wang
Publication year - 2000
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.15760/etd.7477
Subject(s) - design for manufacturability , margin (machine learning) , limit (mathematics) , figure of merit , computer science , quality (philosophy) , process (computing) , process variation , reliability engineering , transistor , engineering , mathematics , electrical engineering , machine learning , mathematical analysis , philosophy , epistemology , voltage , computer vision , operating system