Open AccessAn AFM-SIMS Nano Tomography Acquisition System
Author(s) -
Richard Swinford
Publication year - 2000
Language(s) - Uncategorized
Resource type - Reports
DOI - 10.15760/etd.5369
Subject(s) - focused ion beam , secondary ion mass spectrometry , atomic force microscopy , materials science , ion beam , nano , beam (structure) , analytical chemistry (journal) , ion , nanotechnology , optics , chemistry , physics , composite material , organic chemistry , chromatography
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