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Ion Beam, SEM and EDXRS Analysis on Doped SiO2 Optical Fibres
Author(s) -
S. Hashim,
D.A. Bradley,
Ahmad Termizi Ramli,
H. Wagiran,
M. Webb,
C. Jeynes,
M. Iqbal Saripan,
Mohd Nadzri Md Reba,
K. Alzimami
Publication year - 2012
Publication title -
progress in nuclear science and technology
Language(s) - English
Resource type - Journals
ISSN - 2185-4823
DOI - 10.15669/pnst.3.116
Subject(s) - doping , ion , materials science , focused ion beam , optics , optoelectronics , chemistry , physics , organic chemistry

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