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REVIEW ON OPTICAL AND STRUCTURAL CHARACTERIZATION OF 2D TMDC SEMICONDUCTORS
Author(s) -
Neelakandan.M.S
Publication year - 2016
Publication title -
international journal of research in engineering and technology
Language(s) - English
Resource type - Journals
eISSN - 2321-7308
pISSN - 2319-1163
DOI - 10.15623/ijret.2016.0509039
Subject(s) - characterization (materials science) , semiconductor , materials science , nanotechnology , engineering physics , optoelectronics , engineering

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