RELIABILITY ANALYSIS OF CFT COLUMN BY SIMULATION APPROCH
Author(s) -
Chethan Kumar. S .
Publication year - 2016
Publication title -
international journal of research in engineering and technology
Language(s) - English
Resource type - Journals
eISSN - 2321-7308
pISSN - 2319-1163
DOI - 10.15623/ijret.2016.0507052
Subject(s) - reliability (semiconductor) , column (typography) , reliability engineering , computer science , physics , engineering , telecommunications , quantum mechanics , power (physics) , frame (networking)
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom