Open AccessRELIABILITY ANALYSIS & PREDICTION OF MEAN TIME BETWEEN FAILURE OF FLIGHT DATA RECORDER
Author(s) -
Suneel Kr Srivastava
Publication year - 2015
Publication title -
international journal of research in engineering and technology
Language(s) - English
Resource type - Journals
eISSN - 2321-7308
pISSN - 2319-1163
DOI - 10.15623/ijret.2015.0422014
Subject(s) - reliability (semiconductor) , reliability engineering , mean time between failures , statistics , environmental science , computer science , engineering , mathematics , failure rate , physics , power (physics) , quantum mechanics