Open AccessComputer Simulation of the Diffraction of Millimeter Electromagnetic Waves to Detect Internal Defects of Products Made using Additive Technology
Author(s) -
Oleg V. Kofnov,
Eugeniy Leonidovich Lebedev,
Aleksandr Vladimirovich Mikhailenko
Publication year - 2018
Publication title -
spiiras proceedings
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.242
H-Index - 9
eISSN - 2078-9599
pISSN - 2078-9181
DOI - 10.15622/sp.56.4
Subject(s) - millimeter , diffraction , extremely high frequency , electromagnetic radiation , materials science , optics , acoustics , computer science , physics
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