Open AccessAbduction models in software reliability analysis
Author(s) -
Valkovsky,
Мустафина
Publication year - 2014
Publication title -
trudy spiiran
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.242
H-Index - 9
eISSN - 2078-9599
pISSN - 2078-9181
DOI - 10.15622/sp.2.4
Subject(s) - reliability engineering , computer science , reliability (semiconductor) , software quality , software , software engineering , programming language , engineering , software development , physics , power (physics) , quantum mechanics