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DIOS‐MSEED: A chip‐based method for measurement of enantiomeric excess by kinetic resolution/mass spectrometry
Author(s) -
Shen Zhouxin,
Yao Sulan,
Crowell John E.,
Siuzdak Gary,
Finn M. G.
Publication year - 2002
Publication title -
israel journal of chemistry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.908
H-Index - 54
eISSN - 1869-5868
pISSN - 0021-2148
DOI - 10.1560/tbxu-fd8h-fhm1-nr8h
Subject(s) - chemistry , mass spectrometry , kinetic resolution , resolution (logic) , kinetic energy , enantiomer , enantiomeric excess , desorption , silicon , analytical chemistry (journal) , chromatography , catalysis , enantioselective synthesis , organic chemistry , adsorption , physics , quantum mechanics , artificial intelligence , computer science
The determination of enantiomeric excess by kinetic resolution mass spectrometry has been implemented with the Desorption/Ionization On Silicon (DIOS) MS technique. Measurements can thereby be made much more rapidly than was previously possible, bringing this general methodology for screening asymmetric catalysts closer to true high‐throughput status.