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Towards a Dual‐Tip STM Application in Mesoscopic Electron Transport
Author(s) -
Dana Rami,
Kiruschev Irina,
Tran Phong Dinh,
Doppelt Pascal,
Manassen Yishay
Publication year - 2008
Publication title -
israel journal of chemistry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.908
H-Index - 54
eISSN - 1869-5868
pISSN - 0021-2148
DOI - 10.1560/ijc.48.2.87
Subject(s) - mesoscopic physics , chemistry , scanning tunneling microscope , transconductance , electron , cathode ray , nanotechnology , molecular physics , optoelectronics , condensed matter physics , transistor , physics , materials science , quantum mechanics , voltage
Abstract A new design for a dual‐tip scanning tunneling microscope (STM) is presented. The design is a variation on the mechanically controllable break‐junction with two electron beam‐induced deposition nano‐tips. The new design enables one to scan surfaces simultaneously with two probes having a nano‐gap separation. By collecting the lateral current flowing between the tips, the transconductance map can then be compared with the STM images for local characterizations of the electron transport. Since the lateral beam carries the property of the density of states of the surface at momentum space, the dispersion of the electronic structure should give an orientation and position dependence of the local transconductance current. In addition, the reduced terminal separation, on the order of the characteristic mesoscopic length scales, is likely to be sensitive to a variety of typically observed interactions and interference effects.