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Comprehensive Study of Solar Cell Structure Defects by Means of Noise and Light Emission Analysis
Author(s) -
Robert Macků,
Pavel Koktavý,
Jiří Šicner
Publication year - 2012
Publication title -
advances in electrical and electronic engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.225
H-Index - 19
eISSN - 1804-3119
pISSN - 1336-1376
DOI - 10.15598/aeee.v10i2.620
Subject(s) - microplasma , noise (video) , photon , optics , light emission , optoelectronics , metrology , point (geometry) , solar cell , materials science , electronic engineering , computer science , physics , engineering , artificial intelligence , mathematics , plasma , image (mathematics) , geometry , quantum mechanics

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