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Approaches to identification of fragments of a dislocation etch pit on a semiconductor monocrystal waffer
Author(s) -
А. М. Самойлов,
Igor Shevchenko
Publication year - 2019
Publication title -
zbìrnik naukovih pracʹ nacìonalʹnogo unìversitetu korablebuduvannâ
Language(s) - English
Resource type - Journals
eISSN - 2313-0415
pISSN - 2311-3405
DOI - 10.15589/znp2019.1(475).16
Subject(s) - dislocation , semiconductor , materials science , identification (biology) , crystallography , metallurgy , optoelectronics , composite material , chemistry , biology , botany

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