Open AccessMeasurement of material surface defect intensity by distributed cumulative histogram and clustering
Author(s) -
Roman Melnyk,
Roman Kvit
Publication year - 2020
Publication title -
technology audit and production reserves
Language(s) - English
Resource type - Journals
eISSN - 2706-5448
pISSN - 2664-9969
DOI - 10.15587/2706-5448.2020.210151
Subject(s) - histogram , pixel , artificial intelligence , cluster analysis , image histogram , computer vision , color histogram , mathematics , histogram matching , image segmentation , pattern recognition (psychology) , computer science , image texture , segmentation , image processing , color image , image (mathematics)