Open AccessDegradation process simulation of computer components of discrete devices
Author(s) -
Ольга Віталіївна Кравченко
Publication year - 2015
Publication title -
tehnologìčnij audit ta rezervi virobnictva
Language(s) - English
Resource type - Journals
eISSN - 2312-8372
pISSN - 2226-3780
DOI - 10.15587/2312-8372.2015.51795
Subject(s) - process (computing) , reliability (semiconductor) , durability , degradation (telecommunications) , brittleness , material flow , computer science , material properties , stress (linguistics) , dimensioning , materials science , process engineering , mechanical engineering , reliability engineering , engineering , composite material , physics , telecommunications , ecology , power (physics) , linguistics , philosophy , quantum mechanics , biology , aerospace engineering , operating system