Open AccessTaking into account type I and II errors of switching device for system with hot redundancy
Author(s) -
Ірина Ігорівна Москвіна,
Тетяна Олександрівна Стефанович,
С. В. Щербовських
Publication year - 2015
Publication title -
tehnologìčnij audit ta rezervi virobnictva
Language(s) - English
Resource type - Journals
eISSN - 2312-8372
pISSN - 2226-3780
DOI - 10.15587/2312-8372.2015.51357
Subject(s) - redundancy (engineering) , markov chain , reliability engineering , fault tree analysis , reliability (semiconductor) , computer science , markov process , engineering , mathematics , statistics , power (physics) , physics , quantum mechanics , machine learning