Open AccessRadioelectonic apparatus parametrical reliability predicting with deterministic parameter drift bilateral limitation
Author(s) -
Юрій Ярославович Бобало,
Andriy Bondariev,
Леонід Недоступ,
М. Д. Кіселичник,
Павло Михайлович Заярнюк
Publication year - 2015
Publication title -
tehnologìčnij audit ta rezervi virobnictva
Language(s) - Uncategorized
Resource type - Journals
eISSN - 2312-8372
pISSN - 2226-3780
DOI - 10.15587/2312-8372.2015.42366
Subject(s) - reliability (semiconductor) , quantile , parametric statistics , probabilistic logic , stochastic process , mathematics , statistical physics , computer science , statistics , mathematical optimization , physics , power (physics) , quantum mechanics