Open AccessReliability prediction of discrete devices by modeling the process of material degradation
Author(s) -
Ольга Віталіївна Кравченко
Publication year - 2015
Publication title -
tehnologìčnij audit ta rezervi virobnictva
Language(s) - English
Resource type - Journals
eISSN - 2312-8372
pISSN - 2226-3780
DOI - 10.15587/2312-8372.2015.37697
Subject(s) - reliability (semiconductor) , degradation (telecommunications) , reliability engineering , process (computing) , computer science , layer (electronics) , materials science , electronic engineering , engineering , composite material , power (physics) , physics , quantum mechanics , operating system