Open AccessAnalysis of causes degradation of materials of discrete devices of computer systems
Author(s) -
Артур Анатолійович Златкін,
Ольга Віталіївна Кравченко,
Олександр Сергійович Вовчановський
Publication year - 2014
Publication title -
tehnologìčnij audit ta rezervi virobnictva
Language(s) - English
Resource type - Journals
eISSN - 2312-8372
pISSN - 2226-3780
DOI - 10.15587/2312-8372.2014.27934
Subject(s) - reliability (semiconductor) , computer science , software , reliability engineering , mathematical model , finite element method , computer program , physical system , engineering , structural engineering , mathematics , power (physics) , statistics , physics , quantum mechanics , programming language , operating system